Compute the wavelength that interferes constructively at normal incidence from film index n, thickness t in nanometres and order m. For thin-film optics and reflection enhancement.
输入膜折射率 n、厚度 t(纳米)与级次 m,求相长干涉波长。
| Item | Formula / Note | Source / Standard |
|---|---|---|
| Constructive interference (normal incidence) | 2 n t = m λ, λ = 2 n t / m (convention here: net interface phase shifts cancel) | Standard thin-film interference (Hecht, Optics, §9.8) |
| Optical path difference | OPD = 2 n t, n = film index, t = film thickness | Standard geometrical optics |